Operational
| Beamline | Technical and scientific application | Experimental station | Specification | Source |
|---|---|---|---|---|
| PDIFF | X-ray powder diffraction (XRPD), roentgenography, single-crystal diffraction | 4+2 circle diffractometer | Energy range: 6 - 20 keV Resolution: 2x10-4 ΔE/E |
Dipole magnet |
| FLUO | X-ray fluorescence analysis (XRF), x-ray fluorescence microprobe (μ-XRF), total x-ray reflection fluorescence (TXRF) | Vacuum chamber, SiLi-detector | Energy range: 1 - 30 keV Resolution: 2x10-2 ΔE/E |
Dipole magnet |
| INE | Spectroscopy of actinide samples | Ionization chambers, 5 element Ge detector, 4 axis goniometer for GI-XAFS | Energy range: 2.1 - 25 keV Resolution: 2x10-4 ΔE/E |
Dipole magnet |
| IR 1 | Infrared/THz spectroscopy, ellipsometry | FTIR spectrometer and ellipsometer, liquid He cryostat | Spectral range: 4 - 10000 cm-1 Resolution: 0.1 cm-1 |
Dipole magnet edge |
| LIGA I | Mask fabrication, patterning of thin microstructures | Scanner | Energy range: 2.2 - 3.3 keV | Dipole magnet |
| LIGA II | Deep x-ray lithography | Scanner | Energy range: 2.5 - 12.4 keV |
Dipole magnet |
| LIGA III | Ultra deep x-ray lithography | Scanner | Energy range: 2.5 - 15.0 keV |
Dipole magnet |
| MPI-MF | Surface diffraction, XMCD | 2+3 circle horizontal and vertical diffractometer for high load (300 kg) | Energy range: 5 - 20 keV Resolution: 2x10-4 ΔE/E |
Dipole magnet |
| SCD | Single crystal diffraction, single / multiple anomalous dispersion (SAD/MAD) | 3 axis diffractometer with CCD-detector and 2 axis diffractometer with image plate detector | Energy range: 4 - 20 keV Resolution: 3.5x10-4 ΔE/E |
Dipole magnet |
| SUL-X | X-ray diffraction (XRD), fluorescence analysis (XRF) and x-ray absorption spectroscopy in µ-focus | Vacuum chamber, ionization chambers, 7 element SiLi-detector, 3.5 axis diffractometer + CCD | Energy range: 2.3 (1.5) - 20 keV Resolution: 2x10-4 ΔE/E |
Wiggler |
| TOPO | X-ray white-light topography | 4 axis goniometer, darkroom | White beam | Dipole magnet |
| WERA | Soft x-ray spectroscopy and microscopy, photoemission, absorption, SXMCD | PEEM, 4-element fluorescence detector, electron energy analyzer, sample cryostat, thin-film and sample preparation incl. pulsed laser deposition, UHV sample transfer | Energy range: 100 - 1500 eV Resolution: up to 1x 10-4 ΔE/E |
Dipole magnet (and undulator) |
| XAS | Extended x-ray absorption fine structure (EXAFS), x-ray absorption near edge fine structure (XANES), Q-EXAFS | Ionization chambers, 5 element Ge detector, closed cycle He cryostat, 4 axis goniometer for GI-XAFS | Energy range: 2.3 - 25 keV Resolution: 2x10-4 ΔE/E |
Dipole magnet |
Planning, construction and commissioning:
| Beamline | Technical and scientific application | Experimental station | Specification | Source |
|---|---|---|---|---|
| IR 2 (2009) |
Infrared/THz spectroscopy, microscopy and imaging, near field microscopy (2010) | FTIR spectrometer and microscope, liquid He cryostat, heating stage, FTIR near field microscope (2010) | Spectral range: 4 - 10000 cm-1 Resolution: 0.1 cm-1 |
Dipole magnet edge |
| TopoTomo (2009) |
X-ray microtomography and radiography, x-ray white-light topography | 4 axis goniometer, high-resolution tomography sample stage, medium and high-resolution imaging detectors | Energy range: 10-30 keV Bandwidth: white beam or (from 2008) ΔE/E≈ 10-2 |
Dipole magnet |
| IMAGE (2009) |
Radiography and tomography | Ultra-precise sample manipulator; automatic sample changer system. 2D detector system; energy-dispersive detector | Energy range: 7 - 65 keV Resolution: 10-2 - 10-4 ΔE/E |
Super- conducting combined wiggler / undulator |
| NANO (2008) |
X-ray diffraction (HR-XRD) with highest angular resolution, anomalous scattering, coherent scattering | (1) High-resolution 6-circle diffractometer; (2) heavy-duty diffractometer; MBE chamber, cryostats, superconducting magnet | Energy range: 3 - 30 keV Resolution: 2·10-4 - 10-2 ΔE/E |
Super- conducting undulator |
Annual Joint ANKA-KNMF Users' Meeting
Deadline: Call for Proposals:
January 15, 2011
Activity Report Submission Deadline:
January 15, 2011
Annual Report Submission Deadline:
June 1, 2011